s2000 t

Tri-temp Prober​

S2000-T Tri-temp Prober

An automatic prober with tri-temp test capability

It is an automatic prober with tri-temp test capability. It can test electrical performance of most 8/12-inch wafers through chip probing at 55℃~150℃. The probing force is increased to 450kgf.

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S2000-T Tri-temp Prober

Specifications

DUT Type

Logic, MCU, SOC, DRAM, NAND, etc.

Wafer Size

200mm/300mm

Wafer Thickness

Standard: 200μm-1250μm

Test Site

Max. 2048 site

Index Time

240ms (X: 6mm, Z: 0.5mm)

Probing Force

450kg

Test Temperature

-40℃-150℃±1℃ (optional: -55℃)

MTBF

≥168h

Communication Interface

GPIB, RS-232

Optional Function

Low-noise chuck, APC, Auto-Leveling, Hinge, MES, OHT, etc.

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