nanox 8000 3d profilometer

Metrology Equipment

NanoX-8000 3D Profilometer

Measures critical dimensions of the PCB substrate

It measures critical dimensions of the PCB substrate. The surface structure (3D profile, 2D dimension, and surface roughness) of the PCB substrate will be measured and analyzed.

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NanoX-8000 3D Profilometer

Specifications

Device Size

509mm (W)×610mm (L)×0.05mm (H) ~550mm (W)×650mm (L)×1.2mm (H)

Measuring Mode

Automatic, semi-automatic, manual

Measured Item

Trace, Via, SRO, Land(pad), Dimple, Presolder, SR Flat, Eccntricity, SR Prefile data processing, SR Surface Area

Power

Metallographical objective: 5X, 10X, 20X; interference objective: 20X and 50X

Range

Roughness≥0.25μm, stair height 3μm-75μm, CD dimension 5μm-2000μm

GR&R

Repeatability≤20%; reproducibility≤30%

Code Reading

Automatic Code Reading

Measuring Efficiency

3D measuring≥40s/point; 2D measuring: 2s/point

MTTR

≤3h

MTBF

≥1500h

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